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Thin Film Measurement System TF-VIS

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Price:
$10,950.00
Weight:
3.00 LBS
Shipping:
Calculated at checkout
Quantity:

Product Description

The TF-VIS System has a thickness measurment range from 150A-20um and spectral range from 400-1000nm. StellarNet thin film reflectometry systems consist of a portable USBspectrometer coupled to a reflectance probe and light source. The optical properties are obtained  from reflection and thickness is measured by detecting the sinusoidal fringe pattern from the sample's specular reflectance.  Several  spectrometer models are available to suit your thin film and/or optical measurement requirements.

Visit our Thin Fiilm Webpage for infromation about our other systems. StellarNet Thin-Film Webpage

Other available systems below in grey.

 

System

Range

Resolution

Thickness

Lamp type

Price

TF-VIS

400-1000nm

<2nm

150A-20um

Halogen      SL1

$10,950

TF-C-UVIS   

190-850nm

<2nm

50A-20um

Deuterium  SL3

$13,320 

TF-C-UVIS-SR

220-1100nm

<2.5nm

50A-20um

SL1-F+ SL3

$13,915 

TF-NIR

900-1700nm

<5nm

1000A-200um

Halogen      SL1

$21,575

TF-VIS-NIR

400-1700nm

<2nm,  5>1000

150A-200um

Halogen      SL1

$24,075

TF-C-UVIS-SRN

200-1700nm

<2nm,  5>1000

50A-200um

Hal+Deut    SL4

$26,900 


* Special offer, only available online

 

Precision 0.1Å or 0.01% (greater of) Standard deviation of 100 thickness reading of 100nm SiO2/Si calibration sample
Accuracy 0.2% or 10A (greater of) Film stack dependent
Stability 0.2A or 0.02% (greater of) 2 sigma over 20 days (100 measurements daily) on 100nm/Si calibration sample
Spot size 3 mm standard, optional down to 3 µm  
Sample size from 1 mm  
Computer OS TFC Software designed for 32-bit OS Upgrades available

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